UGWUNNA, C. O.; JOSHUA, J.; ACHEME, I. D.; ORJI, E. E.; BOLARINWA, R. I. Identification of Maize Seed Defects using the Yolo-V5 Algorithmic Framework and Object Recognition Paradigms. African Journal of Pure and Applied Sciences, Nairobi, Kenya, v. 6, n. 2, p. 85–98, 2025. DOI: 10.33886/ajpas.v6i2.740. Disponível em: https://journal.ku.ac.ke/index.php/AJPAS/article/view/740. Acesso em: 1 aug. 2026.